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Tác giả CN
| Le,Canh V. |
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Nhan đề
| Yield-stress based error indicator for adaptive quasi-static yield design of structures /Canh V. Le |
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Nguồn trích
| Computers and structures2016
Số: 1
Tập: 171 |
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| 000 | 00000nab#a2200000ui#4500 |
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| 001 | 18886 |
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| 002 | 6 |
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| 004 | AB1D9339-9E3F-4184-91A6-7285E176CB55 |
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| 005 | 201710231449 |
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| 008 | 081223s vm| vie |
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| 009 | 1 0 |
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| 039 | |y20171023145633|zcuonglv |
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| 100 | |aLe,Canh V. |
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| 245 | |aYield-stress based error indicator for adaptive quasi-static yield design of structures /Canh V. Le |
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| 773 | |tComputers and structures|v171|i1|d2016 |
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| 890 | |c1|a0|b0|d1 |
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