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  • Nhan đề: Planning of step-stress accelerated degradation test based on the inverse Gaussian process /Huan Wang, Guan-jun Wang n , Feng-jun Duan
Tác giả CN Wang,Huan
Nhan đề Planning of step-stress accelerated degradation test based on the inverse Gaussian process /Huan Wang, Guan-jun Wang n , Feng-jun Duan
Từ khóa tự do Inverse Gaussian process
Từ khóa tự do Cumulative exposure model
Từ khóa tự do Step-stress accelerated degradation test
Nguồn trích Reliability Engineering System Safety2016-10 Số: 1 Tập: 154
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100 |aWang,Huan
245 |aPlanning of step-stress accelerated degradation test based on the inverse Gaussian process /Huan Wang, Guan-jun Wang n , Feng-jun Duan
653 |aInverse Gaussian process
653 |aCumulative exposure model
653 |aStep-stress accelerated degradation test
773 |tReliability Engineering System Safety|v154|i1|d2016-10
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